Semiconductor Metrology Basics StdPbc-0520 and wafer fabrication/inspection equipment (tools)

and wafer fabrication/inspection equipment (tools)

or SEMI M38 are specified by customers of silicon wafer suppliers and are usually part of Certificates of Compliance

no materials requirements or microcontamination limits are given

broken down by process nodes and regions

Therefore it is mandatory to operate system under tight statistical process control (SPC)

Semiconductor Metrology Basics StdPbc-0520 and wafer fabrication/inspection equipment (tools)Course Description The THORS Semiconductor Metrology Basics course introduces the learners to the significance of testing in semiconductor manufacturing. This course focuses on key measurements in semiconductor metrology for defect inspection and process control. Presented in THORS' highly visual and interactive learning format, this course will equip the learners with a foundational knowledge of semiconductor metrology. Learning Objectives Recognize